SCSIO OpenIR  > 热带海洋环境国家重点实验室(LTO)
An Expendable Microstructure Profiler for Deep Ocean Measurements
Shang, XD; Qi, YF; Chen, GY; Liang, CR; Lueck, RG; Prairie, B; Li, H; xdshang@scsio.ac.cn
2017
Source PublicationJOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY
Volume34Issue:1Pages:153-165
AbstractMeasurements of turbulence in the deep ocean, particularly close to the bottom, are extremely sparse because of the difficulty and operational risk of obtaining deep profiles near the seafloor. A newly developed expendable instrument-the VMP-X (Vertical Microstructure Profiler-Expendable)-carries two microstructure shear probes to measure the fluctuations of vertical shear into the dissipation range and can profile down to a depth of 6000 m. Data from nine VMP-X profiles in the western Pacific Ocean near 11.6 degrees N over rough topography display bottom-intensified turbulence with dissipation rates increasing by two factors of 10 to 4 x 10(-9) W kg(-1) within 200 m above the bottom. In contrast, over smooth topography in the southern South China Sea near 11 degrees N, three profiles show that turbulence in the bottom boundary layer increases only slightly, with dissipation rates reaching 1 x 10(-10) W kg(-1). The eddy diffusivity over rough topography reached to 5 x 10(-3) m(2) s(-1). The average diffusivity over all depths was 0.3 x 10(-4) and 0.9 x 10(-4) m(2) s(-1) for the tests in the southern South China Sea and in the western Pacific Ocean, respectively, and these values are much larger than previous estimates of less than approximate to 0.1 x 10(-4) m(2) s(-1) for the main thermocline.
Department[Shang, Xiaodong; Qi, Yongfeng; Chen, Guiying; Liang, Changrong] Chinese Acad Sci, State Key Lab Trop Oceanog, South China Sea Inst Oceanol, Guangzhou, Guangdong, Peoples R China; [Lueck, Rolf G.; Prairie, Brett] Rockland Sci Int Inc, Victoria, BC, Canada; [Li, Hua] JFE Advantech Co Ltd, Oceanog Res Lab, Nishinomiya, Hyogo, Japan; [Qi, Yongfeng] Univ Chinese Acad Sci, Beijing, Peoples R China
Funding ProjectLTO
Document Type期刊论文
Identifierhttp://ir.scsio.ac.cn/handle/344004/16423
Collection热带海洋环境国家重点实验室(LTO)
Corresponding Authorxdshang@scsio.ac.cn
Recommended Citation
GB/T 7714
Shang, XD,Qi, YF,Chen, GY,et al. An Expendable Microstructure Profiler for Deep Ocean Measurements[J]. JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY,2017,34(1):153-165.
APA Shang, XD.,Qi, YF.,Chen, GY.,Liang, CR.,Lueck, RG.,...&xdshang@scsio.ac.cn.(2017).An Expendable Microstructure Profiler for Deep Ocean Measurements.JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY,34(1),153-165.
MLA Shang, XD,et al."An Expendable Microstructure Profiler for Deep Ocean Measurements".JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY 34.1(2017):153-165.
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